Ken, Y. (2021). Discover potential companies with solutions to RNA virus problems by using patent information. In Proceedings of the World Intellectual Property Forum: Intellectual Property 2021 toward New Risk, New Challenges & Solutions.
Hsu, W. L., Ken, Y., & Su, F. P. (2017, July). The Study of Classification on Patent Decisions: The Cases from US CAFC. In Proceedings of Portland International Conference on Management of Engineering and Technology (PICMET 2017) (pp. 1-9). IEEE.
Ken, Y., Pai, N. Y., Hung, T. S., & Wu, C. H. (2011). The Measurement of Innovation capability and Competence of Game Software companies through Patent Indicators. In PICMET 2011 Proceedings, July 31 - August 4, Portland, Oregon, USA.
Ken, Y., Huang, T., Wu, C. H., & Shiu, S. H. (2009). A Novel Integrated SEM Based on DEMATEL for Evaluating Technology License Income Performance. In PICMET 2009 Proceedings, August 2-6, Portland, Oregon, USA. (EI Conference)
Ken, Y., Huang, T., Wu, C. H., & Shiu, S. H. (2009). Super-efficiency DEA Model for Evaluating Technology Transfer Performance of U.S. University. In PICMET 2009 Proceedings, August 2-6, Portland, Oregon, USA. (EI Conference)
Ken, Y., Tsai, T. Y., & Hsu, W. L. (2009). The Connection between Patent Litigation with Patent Portfolio-An Empirical Study of U.S. Semiconductor Industry. In PICMET 2009 Proceedings, August 2-6, Portland, Oregon, USA. (EI Conference)
Ken, Y., Hsu, W. L., & Tsai, T. Y. (2009). A study on the factors influencing license income of technology commercialization in United States Universities. In PICMET 2009 Proceedings, August 2-6, Portland, Oregon, USA. (EI Conference)
Wu, C. H., Ken, Y., & Huang, T. (2008). The Support Vector Machine Classification System for Patient Document Information Importance Analysis. In Proceedings of the 2008 International Conference on BioMedical Engineering and Informatics (BMEI 2008) (pp. 375-379). Hainan, China. (IEEE Conference)
Ken, Y., Tsai, T. Y., & Ou, Y. K. (2008). The Study of the Time Lag Effect of Patent Impact on the Profitability of companies: From Innovation to Profit. In PICMET 2008 Proceedings (pp. 2588-2596), July 27-31, Cape Town, South Africa. (EI Conference)
Ken, Y., Cheng, Y. H., & Chen, K. H. (2007). The Study of the Relationship between Patent Quality and Profitability -An Empirical Study of the U.S. Semiconductor Industry. In Proceedings of The 2007 International Conference on Business and Information, July 11-13, Tokyo, Japan.
Kao, F. C., Ken, Y., & Chang, J. (2007). Firm that Transform Scrap of Glass into Gold: The Evolution of Technology of UNIQUE. In PICMET 2007 Proceedings (pp. 1847-1863), August 5-9, Portland, Oregon, USA. (EI Conference)
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